Technologies
MirrorBit™
Architectures
Standard
Burst/Page
MCP Flash and SRAM
Simultaneous Read/Write
Advanced (Burst/Page+Simult. R/W)
Voltages & Densities
1.8V Devices
3.0V Devices
5.0V Devices
Density Families
General Information
Events & Tradeshows
Flash Memory News
Ordering Part Numbers
Legacy
Spansion
OPN Conversion Tool
Technical Documentation
Success Story
Ask AMD Knowledge Base
Spansion Overview
www.spansion.com
Resources for:
Investors
Job Seekers
Press

Density Families
256 Mbit
S29GL256N
Datasheet
Product Overview
Design Tools

S29GLxxxN MirrorBit™ Flash Family

S29GL512N, S29GL256N, S29GL128N


512 Megabit, 256 Megabit, and 128 Megabit, 3.0 Volt-only Page Mode Flash Memory featuring 110nm MirrorBit process technology


General Description
The S29GL512/256/128N family of devices are 3.0V single power flash memory manufactured using 110nm MirrorBit technology. The S29GL512N is a 512 Mbit, organized as 33,554,432 words or 67,108,864 bytes. The S29GL256N is a 256 Mbit, organized as 16,777,216 words or 33,554,432 bytes. The S29GL128N is a 128 Mbit, organized as 8,388,608 words or 16,777,216 bytes. The devices have a 16-bit wide data bus that can also function as an 8-bit wide data bus by using the BYTE# input. The device can be programmed either in the host system or in standard EPROM programmers.


Distinctive Characteristics

Architectural Advantages Performance Characteristics Software Features Hardware Features


Architectural Advantages

  • Single power supply operation
    • 3 volt read, erase, and program operations
  • Enhanced VersatileI/0™ Control
    • All input levels (address, control, and DQ input levels) and outputs are determined by voltage on VIO input. VIO range is 1.65 to VCC
  • Manufactured on 110nm MirrorBit process technology
  • SecSi™ (Secured Silicon) Sector region
    • 128-word/256-byte sector for permanent, secure identification through an 8-word/16-byte random Electronic Serial Number, accessible through a command sequence
    • May be programmed and locked at the factory or by the customer
  • Flexible sector architecture
    • S29GL512N: Five hundred twelve 64 Kword (128 Kbyte) sectors
    • S29GL256N: Two hundred fifty six 64 Kword (128 Kbyte) sectors
    • S29GL128N: One hundred twenty eight 64 Kword (128 Kbyte) sectors
  • Compatibility with JEDEC standards
    • Provides pinout and software compatibility for single-power supply Flash, and superior inadvertent write protection
  • 100,000 erase cycle per sector
  • 20-year data retention at 125°C
Return to Top


Performance Characteristics

  • High performance
    • 80 ns access time (S29GL128N, S29GL256N), 90 ns access time (S29GL512N)
    • 8-word/16-byte page read buffer
    • 16-word/32-byte write buffer
    • 25 ns page read times
    • 6 µs typical write buffer word programming time: 16-word/32-byte write buffer reduces overall programming time for multiple-word updates
  • Low power consumption (typical values at 3.0 V, 5 MHz
    • 30 mA typical interpage active read current;
    • 10 mA typical intrapage active read current
    • 50 mA typical erase/program current
    • 1 µA typical standby mode current
  • Package Options
    • 56-pin TSOP
    • 64-ball Fortified BGA
Return to Top


Software Features
  • Program Suspend & Resume: read other sectors before programming operation is completed
  • Erase Suspend & Resume: read/program other sectors before an erase operation is completed
  • Data# polling & toggle bits provide status
  • Unlock Bypass Program command reduces overall multiple-word or byte programming time
  • CFI (Common Flash Interface) compliant: allows host system to identify and accommodate multiple flash devices
Return to Top


Hardware Features
  • Persistant Sector Protection
  • Password Sector Protection
  • WP#/ACC input accelerates programming time (when high voltage is applied) for greater throughput during system production. Protects first or last sector regardless of sector protection settings
  • Hardware reset input (RESET#) resets device
  • Ready/Busy# output (RY/BY#) detects program or erase cycle completion
Return to Top




©2009 Advanced Micro Devices, Inc.    |    Contact AMD    |    Careers    |    RSS Feeds    |    Terms and Conditions    |    Privacy    |    Trademark information    |    Site Map